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Kimsufi disk problem


Yorki
28/07/2015, 09h30
Hello, I've got problem on my dedicated kimsufi while trying to create new dir, it says: "Input/output error". I need this to be fixed asap

root@dedicated:~# smartctl -a -d ata /dev/sda2
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.10.9-xxxx-grs-ipv6-64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDS723020BLE640
Serial Number: MS77215W0R365A
LU WWN Device Id: 5 000cca 37dca0c2c
Firmware Version: MX4OAAB0
User Capacity: 2,000,398,934,016 bytes [2,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Tue Jul 28 09:28:26 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15300) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 086 086 016 Pre-fail Always - 2949222
2 Throughput_Performance 0x0005 138 138 054 Pre-fail Offline - 76
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 297
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 8
5 Reallocated_Sector_Ct 0x0033 041 041 005 Pre-fail Always - 813
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 124 124 020 Pre-fail Offline - 33
9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 16609
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 8
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 8
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 8
194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 18/45)
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 18956
197 Current_Pending_Sector 0x0022 072 072 000 Old_age Always - 688
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 270 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 270 occurred at disk power-on lifetime: 16588 hours (691 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 08 08 10 40 08 Error: IDNF 8 sectors at LBA = 0x08401008 = 138416136

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 08 08 10 40 e0 00 1d+01:44:14.651 WRITE DMA EXT
35 00 08 08 10 00 e0 00 1d+01:44:14.645 WRITE DMA EXT
35 00 08 08 10 c0 e0 00 1d+01:44:14.639 WRITE DMA EXT
35 00 08 08 10 80 e0 00 1d+01:44:14.632 WRITE DMA EXT
35 00 10 90 11 00 e0 00 1d+01:44:14.630 WRITE DMA EXT

Error 269 occurred at disk power-on lifetime: 16587 hours (691 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 00 10 40 08 Error: UNC 8 sectors at LBA = 0x08401000 = 138416128

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 00 10 40 e0 00 1d+01:07:17.762 READ DMA EXT
35 00 08 78 dd 87 e0 00 1d+01:07:13.652 WRITE DMA EXT
ca 00 08 e8 e4 7f e2 00 1d+01:07:13.644 WRITE DMA
ca 00 08 d0 e4 7f e2 00 1d+01:07:13.635 WRITE DMA
ca 00 08 18 07 15 e1 00 1d+01:07:12.865 WRITE DMA

Error 268 occurred at disk power-on lifetime: 16587 hours (691 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 00 10 40 08 Error: UNC 8 sectors at LBA = 0x08401000 = 138416128

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 00 10 40 e0 00 1d+01:02:17.492 READ DMA EXT
ca 00 08 a8 c2 46 e1 00 1d+01:02:17.198 WRITE DMA
ca 00 70 38 c2 46 e1 00 1d+01:02:17.194 WRITE DMA
ca 00 08 a0 e0 89 e1 00 1d+01:02:17.186 WRITE DMA
ca 00 08 a8 05 15 e1 00 1d+01:02:14.981 WRITE DMA

Error 267 occurred at disk power-on lifetime: 16587 hours (691 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 00 10 40 08 Error: UNC 8 sectors at LBA = 0x08401000 = 138416128

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 00 10 40 e0 00 1d+01:01:28.583 READ DMA EXT
ca 00 08 60 05 15 e1 00 1d+01:01:27.598 WRITE DMA
ca 00 08 c8 b8 46 e1 00 1d+01:01:25.848 WRITE DMA
ca 00 38 90 b8 46 e1 00 1d+01:01:25.839 WRITE DMA
ca 00 08 00 90 88 e1 00 1d+01:01:25.832 WRITE DMA

Error 266 occurred at disk power-on lifetime: 16587 hours (691 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 00 10 40 08 Error: UNC 8 sectors at LBA = 0x08401000 = 138416128

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 00 10 40 e0 00 1d+01:01:21.017 READ DMA EXT
35 00 00 00 94 30 e0 00 1d+01:01:21.008 WRITE DMA EXT
35 00 00 00 90 30 e0 00 1d+01:01:20.984 WRITE DMA EXT
ca 00 08 a0 b6 46 e1 00 1d+01:01:20.377 WRITE DMA
ca 00 38 68 b6 46 e1 00 1d+01:01:20.373 WRITE DMA

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 20 -
# 2 Short offline Completed without error 00% 10 -
# 3 Short offline Completed without error 00% 10 -
# 4 Short offline Completed without error 00% 10 -
# 5 Short offline Completed without error 00% 0 -
# 6 Short offline Completed without error 00% 0 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.